Gigasoft Solves AI’s Biggest Charting Code Problem: Hallucinated Property Names

ProEssentials v10 introduces pe_query.py, the only charting AI tool that validates code against the compiled DLL binary ...

Vadzo Imaging Unveils World’s First 13MP Autofocus USB 3.2 Gen 2×2 Camera for High-Speed Industrial Imaging

Ultra Fast 20Gbps USB 3.2 Gen 2×2 Camera Type C | Onsemi AR1335 Color Camera | ROI Based Autofocus and Auto Exposure | ...
AZoM on MSN

Imaging silicon defects using Raman and PL multivariate imaging

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing ...
Tech Xplore

AI enables defect-aware prediction of metal 3D-printed part quality

A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science ...
IEEE

Defect Detection in Patterned Wafers Using Dynamic Local Adaptive Sensitivity Adjustment

Abstract: In the defect detection of patterned wafers, optical images captured by inspection systems are affected by various noises, resulting in low signal-to-noise ratios in the obtained images, ...
IEEE

Ultrasonic Tomography System for Nut Defect Detection Using Linear Arrays

Abstract: Conventional phased-array ultrasound can detect defects in nuts; however, accurately reconstructing their irregular shapes and precise spatial structures remains challenging. To faithfully ...