Automated DIC imaging with the DM6 M microscope enhances six-inch wafer inspection, providing reproducible results and improved efficiency for defect analysis.

In collaboration with IBM Research, a process for automated visual inspection was developed. The core of the project is based ...

Insurers have always cared about risk, but they are now scrutinizing unpermitted renovations with a new intensity. As more claims trace back to work that never passed inspection, companies are ...

Accurate measurement results depend on regular microscope calibration to ensure consistency and reliability across scientific and industrial use.

Just how small can a QR code be? Small enough that it can only be recognized with an electron microscope. A research team at TU Wien, working together with the data storage technology company Cerabyte ...

For the first time, scientists have been able to watch the flu virus live as it infects human airway cells. They developed a ...

The U.S.-based metrology equipment manufacturer has launched a non-contact photoluminescent imaging system to reveal defects and other non-uniformities in silicon, thin film, and III-V multijunction ...

Traditionally, point-scanning confocal microscopes have used galvanometric (galvo) mirrors to generate high-contrast images of a variety of samples. While highly effective for routine imaging, this ...