Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
Chip testing has become increasingly complex due to the number of variables impacting designs – from design size and complexity, to high transistor counts on advanced technology nodes, to 2.5D/3D ...
Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...
Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...
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