Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...
Design-for-test (DFT) tools are smoothing the way toward complex device designs that are readily testable on economical ATE systems. Vendors of DFT and built-in-self-test (BIST) tools have been ...
With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically — making it almost impossible to test an entire design once it ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results