System reliability and safety are paramount across industries such as semiconductors, energy, automotive, and steel, where even microscopic cracks or defects within structures can critically affect ...
The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...
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