Our friends over at Noah Data have written a research style paper, Introduction to Statistical Analysis and Outlier Detection Methods, that discusses how statistical data can generally be classified ...

Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and ...

Non-parametric tests are used when standard assumptions are not available. These tests don’t rely on distributions, often ...