A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...

Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

In materials science, defects are irregularities or imperfections in a crystal's atomic structure. While they may sound like flaws, defects are often intentionally introduced to enhance properties ...

A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science (KIMS) , in ...

Defect-filled lead-halide perovskites rival silicon solar cells because domain walls inside the material separate and guide charges. Researchers visualized these charge-transport networks using a ...

Much of modern electronic and computing technology is based on one idea: add chemical impurities, or defects, to semiconductors to change their ability to conduct electricity. These altered materials ...

The rapid advancement of 2D materials (2DMs), such as graphene, transition metal dichalcogenides (TMDs), and hexagonal boron nitride (hBN), has revolutionized the field of nanotechnology and ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...