Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

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A methodology to create efficient manufacturing mixed-signal tests that reduce both test costs and test escapes.

Catching all defects in chip packaging is becoming more difficult, requiring a mix of electrical tests, metrology screening, and various types of inspection. And the more critical the application for ...

Synopsys chose the International Test Conference to highlight two significant initiatives: defect-detection enhancements in TetraMAX ATPG through slack-based cell-aware test capability, and a new STAR ...

Please provide your email address to receive an email when new articles are posted on . Researchers found that VRVF results were in reasonable agreement with baseline SAP. VRVF exams had higher ...

To allow faster time-to-market and more complete testing of complex digital devices for new automobiles, EDA market leader Cadence Design Systems Inc. and automatic test equipment supplier Advantest ...