AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...

A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science ...

Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...

Defect-filled lead-halide perovskites rival silicon solar cells because domain walls inside the material separate and guide charges. Researchers visualized these charge-transport networks using a ...

When contamination defects surface in advanced nodes, the root cause often spans tools, materials, and handling. This piece outlines how defect mapping, TEM, and SPC data converge to prove causation.

Defects such as cracks in a material are responsible for everything from malfunctioning microchips to earthquakes. Now MIT engineers have developed a model to predict a defect's birthplace, its ...

Topological defects in liquid crystals guide the self-assembly of molecular amphiphiles. Figure 1: Self-assembly of amphiphiles in nematic liquid-crystal defects. Abbott and co-workers' study raises ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...