With more and more embedded systems being connected, sending state information from one machine to another has become more common. However, sending large packets of data around on the network can be ...

Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...

Many of today's embedded systems are providing more sophisticated solutions to a wide variety of applications and industries. With this increase in sophistication, there is a corresponding increase in ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Modern wireless infrastructure systems use fibers running a CPRI (Common Public Radio Interface) protocol to communicate frequency, phase, complex data, and control information. The demand for ...

IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...