(A) Inverse control architecture, which can reproduce the strain field by inputting target strain field images. (B) Forward control architecture, which can predict the strain field by inputting the ...
A new technical paper, “3D atomic-scale metrology of strain relaxation and roughness in Gate-All-Around transistors via electron ptychography,” was published by researchers at Cornell University, ASM ...
Researchers developed a machine-learning technique that uses an image to estimate the stresses and strains acting on a material. The advance could accelerate engineers' design process by eliminating ...
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