EDN

Cell-aware test can be “Awarding”

Friedrich Hapke, Director of Engineering for Tessent Solutions, Mentor Graphics, received the Bob Madge Innovation Award at the 2015 IEEE International Test Conference (ITC) for Cell-Aware Test. This ...
Semiconductor Engineering

Journey From Cell-Aware To Device-Aware Testing Begins

Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...
Electronic Design

Synopsys addresses FinFET defects, embedded-flash test at ITC

Synopsys chose the International Test Conference to highlight two significant initiatives: defect-detection enhancements in TetraMAX ATPG through slack-based cell-aware test capability, and a new STAR ...
Semiconductor Engineering

Power-Aware Test: Addressing Power Challenges In DFT And Test

Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
EDN

Design for test boot camp, part 3: Advanced fault models and cell-aware test

The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...