The semiconductor industry has long relied on scan ATPG (automatic test pattern generation) tools instead of functional test to create stimulus-response patterns with very high fault coverage. But ...
Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...
New semiconductor technologies like FinFETs are giving rise to new types of fault effects not covered by standard stuck-at and at-speed tests. Automatic test pattern generation (ATPG) tools perform ...
When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...
Ron Press, Technical Marketing Manager, ATPG Products, Janusz Rajski, Chief Scientist and Business Unit Manager, ATPG Product Group, Mentor Graphics Corp., Wilsonville, Ore. A system-on-chip is a ...
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